FIIC 2013
Welcome to FIIC 2013
NOTICE
It is with much regret that we must inform you that the 2013 IEEE Future of Instrumentation International Workshop, scheduled for October 7-9 in Orlando, Florida, has been cancelled.
As you are aware, the government shutdown is having an adverse effect on the federal complex. The 2013 IEEE FIIC is heavily supported by the U.S. Department of Energy's National Laboratories. As a result of the shutdown, we have received a significant number of cancellations, resulting in well below the critical mass of attendees and supporters required to hold a useful meeting. We apologize for the inconvenience this causes and we recommend that you cancel your travel plans immediately.
Authors, please note that we are investigating options for producing a special section or other outlet to publish the 21 selected extended abstracts that have been contributed to 2013 IEEE FIIC. We will be in touch with you soon to discuss this topic further.
Once again, we apologize for the inconvenience this situation causes, and we thank you for your participation in the 2013 IEEE FIIC and hope to see you at a future event.
FIIC 2013 Preliminary Schedule Available October 2, 2013
Future of Instrumentation Report
The Future of Instrumentation International Conference (FIIC) 2013 will provide a forum for research scientists, engineers, and practitioners throughout the world to present their latest research findings, ideas, and applications in the area of advanced instrumentation and associated technology. FIIC 2013 will include keynote addresses and invited presentations by eminent scientists.
Past Workshops on the Future of Instrumentation have focused on trends associated with communications, circuit intricacies, and applications of advanced instrumentation. Tracking both the roadmaps of instrumentation development and the analyses of the instrumentation market(s) generated during those meetings has shown a highly accurate prediction of where “future instruments” are heading – both as R&D efforts and commercialization of advanced technologies. FIIC 2013 will continue to investigate the trend analysis of where future instruments are headed in terms of both technology and market, as well as focusing the program on
areas such as:
• The role of intrinsically safe, very inexpensive instrumentation
• Crowd sourcing and social networking processing of ubiquitous sensors
• The multitude of issues associated with hyper-dense deployments of wireless instrumentation
• Power – or the lack thereof – for advanced instrumentation
• Cyber-Physical System Security – it’s not just an “IT issue”
• Instrumentation in Extreme Environments - e.g. nuclear and fossil power generation, process industries, petrochemical, mining, and gas turbine engine environments.
Conference Goals
FIIC 2013 will focus on advanced instrumentation, measurement concepts and scientific underpinnings that enable new methods and applications of instrumentation. With instrumentation embedded into an expansive array of applications across virtually every aspect of the energy value chain, FIIC hopes to explore new developments relevant to small modular reactors, coal gasification plants, large and small transmission and distribution systems confronted with significant influx of renewable energy systems, and end use applications including demand responsive industrial processes and buildings. The goal is to assemble a group of technologists, analysts and business leaders to investigate the impact of current trends in instrumentation technology across the full expanse of the energy value chain.
Why Participate?
This is your opportunity to intersect with leaders who are at the international forefront of instrumentation for industry, government and academia. You will establish collaborations with scientists and technologists in important areas of energy-related instrument research and learn about government and private sector funding opportunities. FIIC 2013 will provide you with opportunities to broaden your horizon in relation to cross-cutting technologies that are developed in one field while providing applicability to others. Such technologies include new sensing technologies and methods, instrumentation systems capable of surviving harsh industrial environments, advanced materials that enable new miniature low-cost sensors, novel signal processing methods, trustworthy wireless sensor networks, and cyber physical security as it relates to instrumentation and controls systems.
Workshop Topics
Topics of interest include but are not limited to:
• Phenomena, Modeling, and Evaluation of Chemical and Gas Sensors
• Biosensors Optical Sensors
• Mechanical and Physical Sensors
• Sensor/Actuator Systems
• Sensor Networks
• Other Sensor Topics:
o Materials, processes, circuits, signals and interfaces, etc.
o Sensing in cross-contaminant locations
o Small signal extraction (in the presence of large signals)
• Applications:
o Environmental Sensing
o Long range sensing
o Low-cost sensing
o Harsh environment sensing
Prospective authors are invited to submit extended abstracts (3-4 pages) via the FIIC conference website http://FIIC.ieee-ims.org. The abstract should report on original research results of a theoretical or applied nature and explain the significance of the contribution to the research field. The manuscripts must be prepared according to guidelines provided on the FIIC website.
All papers presented at the conference will be published in the Conference Proceedings and via IEEE Xplore. At least one author of any accepted paper must register at non-student rates, attend the conference, and present the paper.
